Sachdev,M. <br/><br/>
Defect-Oriented Testing For Nano-Metric CMOS VLSI Circuits 
By M.Sachdev 
 - 2nd 
 - New Delhi  Springer.New Delhi  2010 
<br/><br/> Engineering 
<br/><br/><label>ISBN: </label>81-8-489429-5 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Mathes